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Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement

  • Audited Supplier
  • 1 yr

Product Specifications

Laser lens Model
Laser lens Range/μm
Z-axis resolution/nm
Spot size/μm

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Product Highlights

  • 3-in-1 integrated design, integrating three core functions of morphology scanning, ultra-depth synthesis & image stitching, and 3D fusion measurement in one unit.
  • It can replace multiple devices including optical profilometer, ultra-DOF microscope, contour measuring instrument and measuring microscope, greatly reducing equipment procurement and space cost.
  • Adopt laser spectral confocal scanning technology with no physical probe contact and zero pressure during measurement, avoiding scratch, deformation or contamination on samples.
  • Compatible with fragile materials such as silicon wafers, thin films, foamed copper and 3D printed parts to realize non-destructive testing.
  • Covering micrometer roughness, millimeter micro-texture and meter-level geometric tolerance samples.
  • New visual selection function with global navigation camera, freely switch navigation view and measurement view, one-click frame selection for large-area or tiny local scanning area.
  • Synchronous focus design of measuring lens and laser lens supports auto anti-collision, greatly speeding up focusing and improving overall testing efficiency by over 50%.
  • Generate true-color/pseudo-color 3D point cloud models, one-click export CSV, Excel, PDF reports and raw point cloud data for traceability.
  • All-in-one intelligent analysis software with complete 2D & 3D measurement tools, supporting batch calculation of planar dimension, contour section, height difference, volume/area, surface roughness .
  • Compatible with various materials including transparent glass, metal, foam, polymer, semiconductor wafer and ceramic.

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Product Images of Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement

Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement pictures & photos
Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement pictures & photos
Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement pictures & photos
Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement pictures & photos
Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement pictures & photos
Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement pictures & photos
Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
  • Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
  • Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
    Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
  • Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
    Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
  • Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
    Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
  • Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
    Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
  • Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
    Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
  • Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
    Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement

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Product Description

Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
Product Description
In high-end manufacturing and precision scientific research fields such as semiconductors, lithium batteries, photovoltaics, and aerospace, the accuracy of microscopic inspection directly determines the quality of products and the level of scientific research achievements. Kathmatic 3 In 1 Precision Measuring Microscope KC-X3000 series three-in-one precision microscope, as a new generation of 3D optical measurement equipment independently developed by Nanjing Kathmatic Technology, integrates three core functions: topography scanning, ultra-depth observation, and fusion measurement. With its cutting-edge technology, rigorous material selection, precise parameters, full-scenario adaptability, and comprehensive service system, it redefines the standards for high-end precision measuring instruments, providing users with a one-stop, non-contact, high-precision microscopic inspection solution.
Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
Specification
Main machine
Model
KC-X3000series
Imaging technology
Laser spectral confocal, true-color image capture, depth synthesis, image stitching
3D point cloud construction method
Point-by-point scanning
XY stage load/kg
5
For more stage types, please consult our company
XY stage movable range/mm
158x128
XY stage drive method
Linear motor
XY stage movable speed
50mm/s
XY stage scanning interval
1~500μm
XY stage scanning direction
X-axis,Y-axis
XY stage scanning method
Fast scanning, Fine scanning
Focus Z-axis movable range
100mm
Focus Z-axis drive method
Electric
Measurement camera resolution
12 million
Measurement camera maximum frame rate
28fps
Light
Inner and outer ring multi-zone four-color light source
Navigation camera FOV/mm
180x120
CPU
Intel i7
Memory
32GB
Storage
1TB SSD
Display resolution
3840x2160
Display size
27 inches
Operating environment temperature
5~40℃
Operating environment humidity
5% to 80%RH, no condensation
Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
3D Digital Microscope
3D Measuring Microscope
Image Dimension Measurement System
Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
infrared Laser Doppler Vibrometer
Ultra-depth 3D Microscope Module
Company Profile
Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
The Kathmatic brand has long been committed to high-end, ultra-precise optical measurement technologies. The company has successively rolled out three product lines: laser interferometry measurement, ultra-high-precision AI-3D microscopic measurement, and ultra-high-definition AI-3D microscopic observation, together with over ten series of products.
Its products have received numerous accolades, including the "Golden Flint Award" issued by the Chinese Society for Optical Engineering, the "Top Ten Innovative Achievements Award" from the Tsinghua University Leading Innovation Industry Expo Forum, and the Second Prize of the Science.
They are widely used in semiconductor, lithium battery, photovoltaic, intelligent manufacturing, 3C,high-end manufacturing, precision machining and manufacturing, and other fields.
Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
Packaging & Shipping
Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
Certifications
Kathmatic Sub-Micrometre Level Roughness Measuring Instrument for Line Width Measurement
FAQ
Q1:How much is it per unit?
A1:Prices vary depending on different models and configurations. Please provide your contact information, and I will arrange for the corresponding technical engineer to provide you with a quotation based on your needs

Q2:Is the software for the equipment compatible?
A2:Yes, the software for the equipment is developed in-house and comes bundled with the equipment, allowing for lifetime use.
Can it be customized and modified according to my needs?
It depends on the specific situation. Please provide your specific requirements, and we will assess whether we can meet them.

Q3:What industries are Kathmatic products primarily used in?
A3:Semiconductor, 3C electronics, lithium battery, photovoltaic, precision mold, automobile, medical, scientific research and universities. Measure chip packaging, solder ball defects, mobile phone parts, battery pole pieces, mold scratches, medical equipment, etc. If you have specific measurement needs, you can contact our online customer service to connect you with a technical engineer.

Q4:What equipment are the Kathmatic models KM, KC, KS, KN, and KV respectively?
A4:KM Series: Auto-3D Image Measurement System (2D+3D + Ultra-Depth of Field + Confocal + Film Thickness), featuring batch flash measurement and full automation
KC Series: 3-in-1 Precision Measuring Microscope, capable of nanoscale topography/roughness/film thickness measurements, commonly used in semiconductors and molds.
KS Series: Ultra DOF 3D Digital Microscope, featuring deep depth of field, high-definition stitching, and microscopic observation, commonly used in scientific research and quality inspection.
KN Series: Ultra DOF 3D Microscopy Module, for production line automation and defect detection.
KV Series: Infrared Laser Doppler Vibrometer, for non-contact measurement of vibration, displacement, and frequency.

About the Supplier

This supplier has been audited by CTI. Verify the report on the official CTI website with ID "QIP-ASI2641067". Items marked "verified" are certified.

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Nanjing Kathmatic Technology Co., Ltd.
Nanjing Kathmatic Technology Co., Ltd.
Nanjing Kathmatic Technology Co., Ltd.
Nanjing Kathmatic Technology Co., Ltd.
Nanjing Kathmatic Technology Co., Ltd.
Nanjing Kathmatic Technology Co., Ltd.
Nanjing Kathmatic Technology Co., Ltd.
Nanjing Kathmatic Technology Co., Ltd.

About Our Factory & Business Background

verified Business Type
Manufacturer/Factory & Trading Company
Address
First Floor, Building B, Fangyuan South Road No. 99, Jiangning Development Zone, Nanjing, Jiangsu, China
verified Plant Area
3580 square meters
verified Number of Employees
294
verified Registered Capital
10,000,000 RMB
verified Average Lead Time
Peak Season Lead Time: 1-3 months
Off Season Lead Time: 1-3 months
verified Nearest Port
Shanghai Port
verified Supply Chain Partners
51

Our Production Capability & Technical Expertise

Main Products
Digital Microscopes, Optical Microscope, 3D Microscope, Laser Microscope, Profiler, Confocal Microscopy, White Light Interferometer, Laser Doppler Vibrometer, Non-Contact Roughness Tester, Doppler Vibrometer
verified Production Lines
4
verified Production Machines
CNC Centre
verified QA/QC inspectors
8 people
verified Inspection Type for Finished Products
100% inspection(Visual inspection & Function inspection)
verified Inspection Method for Finished Products
Have instructions and uniformly followed
verified Customization Options
Customization from Samples, Customization from Designs, Full Customization, Minor Customization, Flexible customization
verified ODM Service Available
Yes
verified R&D Engineers
56 people
verified Traceability of Raw Materials
Yes

Our Industry Experience & Global Business Record

Main Markets
North America, South America, Eastern Europe, Southeast Asia, Africa, Oceania, Mid East, Eastern Asia, Western Europe
verified New Products Launched in Last year
Yes

Our Certifications, Standards & Industry Recognition

verified Management System Certification
ISO9001:2015, ISO45001:2018, ISO14001, Others

FAQ

What projects can KC test?
3D morphology, length/angle/radius/center distance, depth/step, contour, roughness (Ra/Rz/Sa/Sz), flatness, volume/area, defect detection, automatic report generation. Support parallel analysis of multiple devices, scanning and processing in parallel, doubling efficiency.
What samples can KC test?
Metal, graphite, wafer, glass PCB, Copper pads, etched structures, battery electrodes, shot peened parts, fracture surfaces, transparent materials, porous materials, and soft materials can all be tested. Welcome to make an appointment for specific testing needs and sample testing to see the results
What is the difference between KC and ordinary microscopes and profilometers?
Ordinary microscopes can only observe; The profilometer may scratch the sample; KC-X3000 is a one-stop measurement system for non-contact, 3D morphology, size, roughness, and flatness, with nanometer level accuracy and no damage to the sample.
What device is KC-X3000?
KC-X3000 is a three in one precision measuring microscope developed by Kathmatic, which integrates morphology scanning, ultra depth of field observation, and fusion measurement. It uses spectral confocal technology to achieve non-contact, high-precision 3D microscopy measurement.
KC-X3000 three in one precision measuring microscope, what specific functions does "three in one" refer to?
The device integrates three core functions: morphology scanning, ultra depth of field observation, and fusion measurement. One device can replace traditional 3D profilometers, ultra depth of field microscopes, and contour measuring instruments, achieving integrated observation, scanning, and measurement operations.
What is the core measurement principle used in this KC device? What are the advantages?
Equipped with laser spectroscopy confocal technology and a 12 million pixel imaging module, it is not affected by sample material, reflectivity, or surface slope, and can accurately capture micro height information, achieving non-contact, high-precision non-destructive testing.
What industries are KC devices mainly used for?
Widely used in semiconductor, lithium battery, photovoltaic, 3C electronics, aerospace, precision machining, new material research and development, university scientific research and other fields, suitable for both industrial quality inspection and academic research scenarios.
Will KC imaging overexpose samples such as highly reflective metals and silicon wafers?
can't. The equipment is equipped with controllable light sources in red, green, and blue color zones, supporting independent dimming of the inner and outer rings, which can effectively suppress strong light reflection. High reflective wafers and metal parts can also be imaged clearly.
Can KC be tested on transparent materials and thin film samples?
Okay. Spectral confocal technology can be adapted to transparent and semi transparent materials, and can accurately identify surface morphology and film step height.

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